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Institute for Geosciences, University Freiburg

• Optical microscopy laboratory, transmission, reflection, polarizing (LEITZ DM RXP, ZEISS Axioskop), Leica DC 500 microscopic imaging system, 5 circle universal stage LEIT
• Scanning electron microscopy Zeiss DSM 960 with EDX system (Link/Oxford "ISIS") and Zeiss LEO 1525 with EBSD system
• Alpha 2-3000 S deformation apparatus, 3000 kN loading frame, 150 MPa confining pressure vessel and 200°C sample heating facility
• Laser diffraction particle size analyzer (Mineralogical-Geochemical Department)
• Laser scanning device for measurement of topographies at the milimeter-scale
• White light interferometer Contour GT K0, Bruker AXS, for topography analysis, 3 nm vertical res.
• Analogue tectonic lab with Particle Image Velocimetry (PIV) LaVision, 2 sCMOS Cameras 5.5 MPx, 50 Htz, 2D-and 3D strain software
• Preparation laboratory for sample cutting and thin section production
• Processing laboratory for rock samples with rock crusher, different mills, centrifuge, ultrasonic cleaner, magnetic separator, grain size sieving
• X-ray fluorescence spectrometer Philips 2404 (Mineralogical-Geochemical Department)
• Computational facilites with large data storage equipped for handling remote sensing imagery

Fraunhofer Institute for High-Speed Dynamics, Ernst-Mach-Institut

• Light gas gun facilities (SLGG and XLLGG machines)
• High-Speed Video Camera, corresponding light flashes
• Instrumentation for time resolved spectroscopy: streak camera, 250 mm spectrograph, 750 mm spectrograph
• Instrumentation for laser lightsheet technique: illumination laser, high speed video camera
• Planar-Plate-Impact facility for the investigation of dynamic material behavior at strain rates >104/s
• Hopkinson-Bar for the investigation of dynamic material behavior at strain rates 30-103/s

Computing facilities:
• Computer cluster (Linux), 752 cores, 1500 GB RAM
• File space storage (RAID system), currently ~ 150 TB

Museum für Naturkunde, Leibniz Institute at the Humboldt University Berlin

• Electron microprobe JEOL JXA 8500A with field emission cathode, 4 wavelength-dispersive spectrometers and one energy-dispersive spectrometer
• Electron microprobe JEOL JXA 8500F equipped with a field emission cathode and five wavelength-dispersive spectrometers and an energy-dispersive spectrometer
• Scanning electron microscope (SEM) JEOL JSM 6300 with RÖNTEC energy dispersive analytical system
• Scanning electron microscope (SEM) JEOL JSM-6610 equipped with LaB6 cathode, Bruker AXS Quantax 800 EDX-System with automatic particle analysis and effective from mid 2013 EBSD system Bruker QUANTAX CrystAlign 400
• RAMAN spectrometer DILOR Typ LabRAM 010 with internal HeNe (632,8 nm) and external INNOVA Krypton 90K laser, scanning device MS 75/50 with 0.1 μm steps and heating stage for up to 1500°C
• Cathodoluminiscence microscope (hot cathode) Lumic HC3-LM
• X-ray fluorescence analyser Bruker S8 Tiger fully automated for bulk analysis of major and trace elements including preparation laboratory for glass and powder samples
• Preparation laboratory for rock sample cutting and thin section production
• Processing laboratory for rock samples with rock crusher, different mills, centrifuge, ultrasonic cleaner, magnetic separator FRANTZ LB-1
• Optical microscopy laboratory with several binoculars and polarized and reflected light microscopes (OLYMPUS SZH-10, LEITZ DM RXP, ZEISS Axioskop) with photographic apploications, Leica DC 300 microscopic imaging system, 5 circle universal stage LEITZ
• Q-Win Leica Materials Workstation, imaging analysis software package Q-WIN containing software Q550MW, QGrain and QPhase

Computing facilities:
• Computer cluster (Linux), 456 cores, 2176 GB RAM
• File space storage (RAID system), currently ~30 TB (reserved for modeling work group)
• Graphic workstations for visualization of models

Institute for Planetology, Westfälische Wilhelms-Universität Münster

• SEM JSM-840 A equipped with Oxford Instruments INKA [EDX], and EDX-system LINK AN 10/25 S for quantitative micro analytics, and digital imaging system [SIS]
• field-emission SEM JEOL 6300F Oxford Instruments INKA [EDX] and digital imaging system [SIS])
• JEOL superprobe JXA-8900M WD/ED combined microanalyzer
• JEOL JSM6610-LV with LaB6 Kathode and Centaurus detector for BSE and CL, Oxford Instruments Silicium drift detektor (SSD) X-MAX 20 mm2, HKLNordlys EBSD Camera with Channel5 Software
• THERMO Element 2, equipped with a NEW WAVE UP 193nm High Energy Excimer laser ablation system

Centre for Building Materials at the Technical University of Munich

• 16-chanel acoustic emission monitoring system with pre-amplifiers
• 12-chanel ultrasound shear wave array A1220 of ACSY
• 1,6 GHz RADAR antenna and measurement system with Reflex-W data processing software
• 4-channel Scada s vibration and modal analysis measurement system by LMS with modal hammer and software
• NMR-Mouse and Hf sensor MOIST 100 micro wave measurement device
• Several different ultrasound and acoustic emission sensors, e.g. Glaser-type SteveCo high-fidelity sensors purchased by DFG.
• Several ultrasound emitters.

German Research Centre for Geosciences

• Servohydraulically controlled Loading Frame (MTS, USA), 4500 kN total capacity, stiffness 1010 N/m, with 200 MPa confining pressure chamber.
• Two independent pore fluid/gas pumps (Quizix, USA), able to apply up to 140MPa pore pressure to the rock sample during triaxial loading.
• P- and S- wave ultrasonic sensors (GFZ, Germany), used for ultrasonic velocities and acoustic emission measurements in the frequency range 0.1-2 MHz during sample loading.
• Acoustic Emission data acquisition system (Prökel, Germany), 12 channels, 10 MHz sampling rate, 16 bit amplitude resolution equipped with 6 Gb internal memory buffer.
• Linux cluster with different types of processors (4 to 24 core AMD opteron processors), in
total > 1000 cores, infiniband communication, total memory > 1 TB
• Transmission electron microscope TECNAI F20 X-Twin
• Focussed ion beam facility FEI TEM200 FIB

University Jena

• Thin section preparation: grinding and polishing machines Logitech LP50 and PM5; universal saw
• Ion milling: GATAN Duomill
• X-ray powder diffractometer: Bruker D8 Advance with DAVINCI design, Cu K radiation
• Thermal analysis systems: Netzsch STA 429 and 404 - DTA-TGA-MS; SETERAM TA 92 (TGIDTA);
Mettler DTA-TGA; Hartmann & Braun DTA-TGA; DEGAS: Decoupled Evolved Gas Analysis system with
quadrupole mass spectrometry (up to 1500°C)
• Light microscopy: Zeiss AXIO Imager.M2m and ZEISS Axioplan (polarizing microscopes), Neophot 31
(reflected light microscope), Jenaval (Phako, DIK), refractometer, binoculars
• Microprobe: JEOL JXA-8230 Superprobe (5 WDX and 1 EDX spectrometer) with PointLogger
• Scanning electron microscope with focused ion beam (SEM/FIB): Quanta 3D FEG DualBeam with field
emission gun, EDAX Genesis EDX system, Gallium ion source, gas injection system, Omniprobe
• Transmission electron microscope:l ZEISS LEO 922 (200 kV) with ThermoNoran Six EDX microanalysis
system, Omega in-column filter, Troendle 2K CCD camera, and Gatan double tilt holder

DESY, Hamburg

• Preparation lab for assembly, alignment, and loading of normal and resistive heated Diamond Anvil
Cells (Stereo Microscopes, Electro Discharge Machine, gas loading capabilities)
• Automated membrane pressure controllers, pressure jump controller and setup for dynamic DAC
• Online laser heating facility for double sided heating of a sample in the DAC and double sided
temperature measurements (build by the Uni. of Frankfurt, PI B. Winkler funded through the BMBF
Verbundforschungs project).
• Offline alignment and Ruby measurement systems for measurement of pressure via ruby fluoresces
• Micro Raman system for complementary analysis of pre and post experimental analysis of the